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Test Data Acquisition

Test automation software used for automated testing is innovative and consists of various different modules. Creating test cases, test case handlers and executers are highly important modules in any automated testing software. One of the most important modules is the one responsible for data acquisition in automated testing. This module is highly crucial in acquiring data which is imperative to handle in the entire automated testing procedure. This data needs to be properly acquired from the test equipment and then manipulated as well as stored in the proper manner. This is the reason why a number of different protocols are used for the acquisition of data from the test equipment.

LXI –LAN extension:

One of the most commonly used protocols is the LXI –LAN extension for instrumentation. The protocol has been developed by the LXI consortium and plays a major role in promoting the standard as well as ensuring interpretability. The major role of this protocol is in defining the communication standard as well as the exchange of data as well as its acquisition for those systems which use Ethernet as the communication standard. One feature of this standard is that it defines the data traveling through Ethernet. This is then applied to measurement and testing procedures through the test equipment. The test equipment whose test data acquisition can be obtained through this standard offers great advantages.

Test equipment which uses this standard for test data acquisition
is in great demand in the present day industrial set up.

 

RS 232:

Another commonly used standard is the Recommended Standard 232, commonly referred to as RS 232. One of the most important applications of this standard is that it defines various electrical standards such as the signal rates, the voltage levels, etc. The mechanical characteristics of the interface, pin definitions as well as specifications are also defined by this important standard. The test data acquisition through the RS 232 standard takes place in the form of time series of data bits. This standard extends support to both asynchronous as well as synchronous transfer of data through the entire circuitry of the test equipment. The standard  is also of great use in the definition of the various voltage levels of the transmission as well as control lines, corresponding to both logic zero and logic one. These voltage levels may differ from circuit to circuit depending upon the input voltages put into the test equipment.

 

Article published March 2nd, 2010
Versatyle.com – Test Data Acquisition

 

 

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